@article{NeidhardtKeeBessler2013,
  author    = {Jonathan Philipp Neidhardt and Robert J. Kee and Wolfgang G. Bessler},
  title     = {Electrode Reoxidation in Solid-Oxide Cells: Detailed Modeling of Nickel Oxide Film Growth},
  series   = {ECS Transactions},
  volume    = {57},
  number    = {1},
  organization    = {Electrochemical Society},
  issn      = {1938-5862},
  doi       = {10.1149/05701.2573ecst},
  pages     = {2573 -- 2582},
  year      = {2013},
  abstract  = {The lifetime and performance of solid-oxide fuel cells (SOFC) and electrolyzer cells (SOEC) can be significantly degraded by oxidation of nickel within the electrode and support structures. This paper documents a detailed computational model describing nickel oxide (NiO) formation as a growing film layer on top of the nickel phase in Ni/YSZ composite electrodes. The model assumes that the oxidation rate is controlled by transport of ions across the film (Wagner's theory). The computational model, which is implemented in a two-dimensional continuum framework, facilitates the investigation of alternative chemical reaction and transport mechanisms. Model predictions agree well with a literature experimental measurement of oxidation-layer growth. In addition to providing insight in interpreting experimental observations, the model provides a quantitative predictive capability for improving electrode design and controlling operating conditions.},
  language  = {en}
}