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Detecting vibrations in digital holographic multiwavelength measurements using deep learning

  • Digital holographic multiwavelength sensor systems integrated in the production line on multi-axis systems such as robots or machine tools are exposed to unknown, complex vibrations that affect the measurement quality. To detect vibrations during the early steps of hologram reconstruction, we propose a deep learning approach using a deep neural network trained to predict the standard deviation ofDigital holographic multiwavelength sensor systems integrated in the production line on multi-axis systems such as robots or machine tools are exposed to unknown, complex vibrations that affect the measurement quality. To detect vibrations during the early steps of hologram reconstruction, we propose a deep learning approach using a deep neural network trained to predict the standard deviation of the hologram phase. The neural network achieves 96.0% accuracy when confronted with training-like data while it achieves 97.3% accuracy when tested with data simulating a typical production environment. It performs similar to or even better than comparable classical machine learning algorithms. A single prediction of the neural network takes 35 µs on the GPU.zeige mehrzeige weniger

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Metadaten
Dokumentart:Zeitschriftenartikel, wissenschaftlich
Review-Status:Begutachtet (reviewed)
Zitierlink: https://opus.hs-offenburg.de/10394
Bibliografische Angaben
Titel (Englisch):Detecting vibrations in digital holographic multiwavelength measurements using deep learning
Verfasserangaben:Tobias StörkORCiD, Tobias Seyler, Markus Fratz, Alexander Bertz, Stefan HenselStaff MemberORCiDGND, Daniel Carl
Erscheinungsjahr:2024
Urhebende Körperschaft:Optical Society of America
Verlag:Optica Publishing Group
Erste Seite:B32
Letzte Seite:B41
Titel des übergeordneten Werkes (Englisch):Applied Optics
Jahrgang (Band):63
Heft (Ausgabe):7
ISSN:1559-128X (Print)
ISSN:2155-3165 (Online)
DOI:https://doi.org/10.1364/AO.507303
Sprache:Englisch
Inhaltliche Informationen
Fakultäten / Einrichtungen:Fakultät Elektrotechnik, Medizintechnik und Informatik (EMI) (ab 04/2019)
Sammlungen der Hochschule Offenburg:Bibliografie
DDC-Sachgruppen:500 Naturwissenschaften und Mathematik
Freies Schlagwort / Tag:Deep Learning; Holographie
Formale Angaben
Open-Access-Status: Open Access 
 Hybrid 
Lizenz (Deutsch):License LogoUrheberrechtlich geschützt