Unified Test Environment for LPWAN and Cellular IoT
| Document Type: | Conference Proceeding |
|---|---|
| Conference Type: | Konferenzartikel |
| Zitierlink: | https://opus.hs-offenburg.de/3857 | Bibliografische Angaben |
| Title (English): | Unified Test Environment for LPWAN and Cellular IoT |
| Conference: | Embedded World Conference 2019, Nuremberg, Germany, February 26-28, 2019 |
| Author: | Jubin Sebastian ElayanithottathilStaff MemberGND, Manuel SchappacherStaff MemberORCiDGND, Axel SikoraStaff MemberORCiDGND |
| Year of Publication: | 2019 |
| Place of publication: | Haar |
| Publisher: | WEKA FACHMEDIEN GmbH |
| Page Number: | 4 |
| First Page: | 187 |
| Last Page: | 191 |
| Parent Title (English): | Proceedings of Embedded World Conference 2019, Nuremberg, Germany, 26.-28.02.2019 |
| Language: | English | Inhaltliche Informationen |
| Institutes: | Fakultät Elektrotechnik, Medizintechnik und Informatik (EMI) (ab 04/2019) |
| Collections of the Offenburg University: | Bibliografie | Formale Angaben |
| Open Access: | Closed Access |
| Licence (German): |  Urheberrechtlich geschützt |