Impact of Intrinsic Capacitances on the Dynamic Performance of Printed Electrolyte-Gated Inorganic Field Effect Transistors
- Electrolyte-gated, printed field-effect transistors exhibit high charge carrier densities in the channel and thus high on-currents at low operating voltages, allowing for the low-power operation of such devices. This behavior is due to the high area-specific capacitance of the device, in which the electrolyte takes the role of the dielectric layer of classical architectures. In this paper, weElectrolyte-gated, printed field-effect transistors exhibit high charge carrier densities in the channel and thus high on-currents at low operating voltages, allowing for the low-power operation of such devices. This behavior is due to the high area-specific capacitance of the device, in which the electrolyte takes the role of the dielectric layer of classical architectures. In this paper, we investigate intrinsic double-layer capacitances of ink-jet printed electrolyte-gated inorganic field-effect transistors in both in-plane and top-gate architectures by means of voltage-dependent impedance spectroscopy. By comparison with deembedding structures, we separate the intrinsic properties of the double-layer capacitance at the transistor channel from parasitic effects and deduce accurate estimates for the double-layer capacitance based on an equivalent circuit fitting. Based on these results, we have performed simulations of the electrolyte cutoff frequency as a function of electrolyte and gate resistances, showing that the top-gate architecture has the potential to reach the kilohertz regime with proper optimization of materials and printing process. Our findings additionally enable accurate modeling of the frequency-dependent capacitance of electrolyte/ion gel-gated devices as required in the small-signal analysis in the circuit simulation.…
Author: | Xiaowei Feng, Christian Punckt, Gabriel Cadilha Marques, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-HagmannORCiDGND |
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Creating Corporation: | IEEE |
Year of Publication: | 2019 |
Language: | English |
Parent Title (English): | IEEE Transactions on Electron Devices |
Volume: | 66 |
Issue: | 8 |
ISSN: | 0018-9383 (Print) |
ISSN: | 1557-9646 (Online) |
First Page: | 3365 |
Last Page: | 3370 |
Document Type: | Article (reviewed) |
Institutes: | Bibliografie |
Acces Right: | Zugriffsbeschränkt |
Release Date: | 2020/01/23 |
Licence (German): | ![]() |
DOI: | https://doi.org/10.1109/TED.2019.2919933 |