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TLC-Analysis in forensic sciences using a diode-array detector

  • HPTLC (High Performance Thin Layer Chromatography) is a well known and versatile separation method which shows many advantages when compared to other separation techniques. The method is fast and inexpensive and does not need time-consuming pretreatments. For visualisation of the sample distribution on a HPTLC-plate we developed a new and sturdy HPTLC-scanner. The scanner allows simultaneousHPTLC (High Performance Thin Layer Chromatography) is a well known and versatile separation method which shows many advantages when compared to other separation techniques. The method is fast and inexpensive and does not need time-consuming pretreatments. For visualisation of the sample distribution on a HPTLC-plate we developed a new and sturdy HPTLC-scanner. The scanner allows simultaneous registrations of spectra in a range from 198 nm to 612 nm with a spectral resolution of better than 0.8 nm. The on-plate spatial resolution is better than 160 μm. The measurement of 450 spectra in one separation track does not need more than two minutes. The new diode-array scanner offers a fast survey over a TLC-separation and makes various chemometric applications possible. For compound identification a cross-correlation function is described to compare UV sample spectra with appropriate library data. The cross-correlation function herein described can also be used for purity testing. Unresolved peaks can be virtually separated by use of a least squares fit algorithm. In summary, the diode arry system delivers much more information than the commonly used TLC-scanner.show moreshow less

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Metadaten
Document Type:Conference Proceeding
Conference Type:Konferenzartikel
Zitierlink: https://opus.hs-offenburg.de/3478
Bibliografische Angaben
Title (English):TLC-Analysis in forensic sciences using a diode-array detector
Conference:International Symposium on Chromatography (23. : October 1-5, 2000 : London, UK)
Author:Bernd SpangenbergStaff MemberORCiDGND, Björn Ahrens, Karl-Friedrich Klein
Year of Publication:2001
Publisher:Vieweg
First Page:S438
Last Page:S441
Parent Title (English):Chromatographia : An International Journal for Separation Science
Volume:53
Issue:Suppl. 1
ISSN:0009-5893
DOI:https://doi.org/10.1007/BF02490372
Language:English
Inhaltliche Informationen
Institutes:Fakultät Maschinenbau und Verfahrenstechnik (M+V)
Institutes:Bibliografie
GND Keyword:Dünnschichtchromatographie; Gerichtliche Wissenschaften; Scanner; Spektrum
Formale Angaben
Open Access: Closed Access 
Licence (German):License LogoUrheberrechtlich geschützt