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Does the Kubelka - Munk Theory Describe TLC Evaluations Correctly?

  • In thin-layer chromatography the development step distributes the sample throughout the layer, a process which strongly affects the reflection signals. The essential requirement for quantitative thinlayer chromatography is not a constant sample concentration but constant sample distribution in each sample spot. This makes evaporation of the mobile phase extremely important, because all tracks of aIn thin-layer chromatography the development step distributes the sample throughout the layer, a process which strongly affects the reflection signals. The essential requirement for quantitative thinlayer chromatography is not a constant sample concentration but constant sample distribution in each sample spot. This makes evaporation of the mobile phase extremely important, because all tracks of a TLC plate must be dried uniformly. This paper shows that quantitative TLC is possible even if the concentration of the sample is not constant throughout the layer or if the distribution of the sample is not known. With uniform sample distribution, classical Kubelka-Munk theory is valid for isotropic scattering only. In the absence of this constraint classical Kubelka-Munk theory must be extended to situations where scattering is asymmetric. This can be achieved by modification of the original Kubelka-Munk equation. Extended theory is presented which is not only capable of describing asymmetrical scattering in TLC layers but also includes a formula for absorption and fluorescence in diode-array TLC. With this new theory all different formulas for diode-array thin-layer chromatographic evaluation are combined in one expression.show moreshow less

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Metadaten
Document Type:Article (unreviewed)
Zitierlink: https://opus.hs-offenburg.de/848
Bibliografische Angaben
Title (English):Does the Kubelka - Munk Theory Describe TLC Evaluations Correctly?
Author:Bernd SpangenbergStaff MemberORCiDGND
Year of Publication:2006
First Page:332
Last Page:341
Parent Title (English):JPC-Journal of Planar Chromatography
Volume:19
Issue:111
ISSN:0933-4173
DOI:https://doi.org/10.1556/JPC.19.2006.5.1
Language:English
Inhaltliche Informationen
Institutes:Fakultät Maschinenbau und Verfahrenstechnik (M+V)
Institutes:Bibliografie
Formale Angaben
Open Access: Closed Access 
Licence (German):License LogoUrheberrechtlich geschützt