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A Novel Virtualized Testbed for Embedded Networking Nodes (VTENN)

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Author:Axel Sikora, Manuel Schappacher, Artem Yushev
Year of Publication:2017
Parent Title (English):Proc. of the 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 22-25 May 2017, Torino, Italy
First Page:1
Last Page:6
Document Type:Conference Proceeding
Institutes:Hochschule Offenburg / Bibliografie
Release Date:2018/01/17
Licence (German):License LogoEs gilt das UrhG