Accuracy Improvements of Identification and Authentication of Devices by EM-Measurements
- The authentication method of electronic devices, based on individual forms of correlograms of their internal electric noises, is well-known. Specific physical differences in the components – for example, caused by variations in production quality – cause specific electrical signals, i.e. electric noise, in the electronic device. It is possible to obtain this information and to identify theThe authentication method of electronic devices, based on individual forms of correlograms of their internal electric noises, is well-known. Specific physical differences in the components – for example, caused by variations in production quality – cause specific electrical signals, i.e. electric noise, in the electronic device. It is possible to obtain this information and to identify the specific differences of the individual devices using an embedded analog-to-digital converter (ADC). These investigations confirm the possibility to identify and authenticate electronic devices using bit templates, calculated from the sequence of values of the normalized autocorrelation function of noise. Experiments have been performed using personal computers. The probability of correct identification and authentication increases with increasing noise recording duration. As a result of these experiments, an accuracy of 98.1% was achieved for a 1 second-long registration of EM for a set of investigated computers.…
Document Type: | Conference Proceeding |
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Conference Type: | Konferenzartikel |
Zitierlink: | https://opus.hs-offenburg.de/4553 | Bibliografische Angaben |
Title (English): | Accuracy Improvements of Identification and Authentication of Devices by EM-Measurements |
Conference: | 2020 IEEE 5th International Symposium on Smart and Wireless Systems within the Conferences on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS-SWS), 17-18 Sept. 2020, Dortmund, Germany |
Author: | Axel SikoraStaff MemberORCiDGND, Elena Nyemkova, Yuriy Lakh |
Year of Publication: | 2020 |
Publisher: | IEEE |
Page Number: | 5 |
Parent Title (English): | IEEE IDAACS-SWS 2020 : 5th IEEE International Symposium on Smart and Wireless Systems within the International Conferences on Intelligent Data Acquisition and Advanced Computing Systems : Conference Proceedings |
ISBN: | 978-1-7281-9960-3 (digital) |
ISBN: | 978-1-7281-9961-0 (Print on Demand) |
DOI: | https://doi.org/10.1109/IDAACS-SWS50031.2020.9297071 |
Language: | English | Inhaltliche Informationen |
Institutes: | Forschung / ivESK - Institut für verlässliche Embedded Systems und Kommunikationselektronik |
Fakultät Elektrotechnik, Medizintechnik und Informatik (EMI) (ab 04/2019) | |
Institutes: | Bibliografie | Formale Angaben |
Open Access: | Closed Access |
Licence (German): | Urheberrechtlich geschützt |