A Hybrid System Architecture for the Readout of a Printed Physical Unclonable Function
- Uncontrollable manufacturing variations in electrical hardware circuits can be exploited as Physical Unclonable Functions (PUFs). Herein, we present a Printed Electronics (PE)-based PUF system architecture. Our proposed Differential Circuit PUF (DiffC-PUF) is a hybrid system, combining silicon-based and PE-based electronic circuits. The novel approach of the DiffC-PUF architecture is to provide aUncontrollable manufacturing variations in electrical hardware circuits can be exploited as Physical Unclonable Functions (PUFs). Herein, we present a Printed Electronics (PE)-based PUF system architecture. Our proposed Differential Circuit PUF (DiffC-PUF) is a hybrid system, combining silicon-based and PE-based electronic circuits. The novel approach of the DiffC-PUF architecture is to provide a specially designed real hardware system architecture, that enables the automatic readout of interchangeable printed DiffC-PUF core circuits. The silicon-based addressing and evaluation circuit supplies and controls the printed PUF core and ensures seamless integration into silicon-based smart systems. Major objectives of our work are interconnected applications for the Internet of Things (IoT).…
Author: | Lukas ZimmermannORCiDGND, Alexander ScholzORCiD, Axel SikoraORCiDGND, Jasmin Aghassi-HagmannORCiDGND |
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Contributing Corporation: | IEEE |
Place of publication: | Piscataway |
Year of Publication: | 2018 |
Pagenumber: | 4 |
ISBN: | 978-1-5386-5752-2 (digital) |
ISBN: | 978-1-5386-5751-5 (USB) |
ISBN: | 978-1-5386-5753-9 (Print on Demand) |
Language: | English |
Parent Title (English): | Conference Proceedings of 2018 International Conference on Electronics Technology |
First Page: | 11 |
Last Page: | 14 |
Document Type: | Conference Proceeding |
Institutes: | Bibliografie |
Release Date: | 2019/01/17 |
Licence (German): | ![]() |
Note: | 2018 International Conference on Electronics Technology (ICET), 23-27 May 2018, Chengdu, China |
DOI: | https://doi.org/10.1109/ELTECH.2018.8401395 |