Unified Test Environment for LPWAN and Cellular IoT
Document Type: | Conference Proceeding |
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Conference Type: | Konferenzartikel |
Zitierlink: | https://opus.hs-offenburg.de/3857 | Bibliografische Angaben |
Title (English): | Unified Test Environment for LPWAN and Cellular IoT |
Conference: | Embedded World Conference 2019, Nuremberg, Germany, February 26-28, 2019 |
Author: | Jubin Sebastian ElayanithottathilStaff MemberGND, Manuel SchappacherStaff MemberGND, Axel SikoraStaff MemberORCiDGND |
Year of Publication: | 2019 |
Place of publication: | Haar |
Publisher: | WEKA FACHMEDIEN GmbH |
Page Number: | 4 |
First Page: | 187 |
Last Page: | 191 |
Parent Title (English): | Proceedings of Embedded World Conference 2019, Nuremberg, Germany, 26.-28.02.2019 |
Language: | English | Inhaltliche Informationen |
Institutes: | Fakultät Elektrotechnik, Medizintechnik und Informatik (EMI) (ab 04/2019) |
Institutes: | Bibliografie | Formale Angaben |
Open Access: | Closed Access |
Licence (German): | Urheberrechtlich geschützt |