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Dynamic mapping of EDDL device descriptions to OPC UA

  • OPC UA (Open Platform Communications Unified Architecture) is already a well-known concept used widely in the automation industry. In the area of factory automation, OPC UA models the underlying field devices such as sensors and actuators in an OPC UA server to allow connecting OPC UA clients to access device-specific information via a standardized information model. One of the requirements of theOPC UA (Open Platform Communications Unified Architecture) is already a well-known concept used widely in the automation industry. In the area of factory automation, OPC UA models the underlying field devices such as sensors and actuators in an OPC UA server to allow connecting OPC UA clients to access device-specific information via a standardized information model. One of the requirements of the OPC UA server to represent field device data using its information model is to have advanced knowledge about the properties of the field devices in the form of device descriptions. The international standard IEC 61804 specifies EDDL (Electronic Device Description Language) as a generic language for describing the properties of field devices. In this paper, the authors describe a possibility to dynamically map and integrate field device descriptions based on EDDL into OPCUA.show moreshow less

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Metadaten
Document Type:Conference Proceeding
Conference Type:Konferenzartikel
Zitierlink: https://opus.hs-offenburg.de/2608
Bibliografische Angaben
Title (English):Dynamic mapping of EDDL device descriptions to OPC UA
Conference:International Conference on Measurement Instrumentation and Electronics (2. : 9-11 June 2017 : Prague, Czech Republic)
Author:Axel SikoraStaff MemberORCiDGND, Manuel SchappacherStaff MemberGND, Kofi Atta NsiahStaff Member
Year of Publication:2017
Date of first Publication:2017/07/01
Publisher:IOP Publishing Ltd
Page Number:8
First Page:012006
Parent Title (English):Journal of Physics: Conference Series
Volume:870
ISSN:1742-6588 (Print)
ISSN:1742-6596 (Online)
DOI:https://doi.org/10.1088/1742-6596/870/1/012006
URL:http://iopscience.iop.org/1742-6596/870/1/012006/pdf/1742-6596_870_1_012006.pdf
Language:English
Inhaltliche Informationen
Institutes:Forschung / ivESK - Institut für verlässliche Embedded Systems und Kommunikationselektronik
Fakultät Elektrotechnik und Informationstechnik (E+I) (bis 03/2019)
Institutes:Bibliografie
Formale Angaben
Open Access: Open Access 
Licence (German):License LogoCreative Commons - Namensnennung