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Pairwise Testing - Unentdeckten Fehlern auf der Spur

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Metadaten
Author:Daniel FischerGND, D. Seitel
Creating Corporation:Embedded-Software-Engineering-Kongress ; 7. bis 9. Dezember 2010, Sindelfingen
Publisher:Vogel Business Media
Place of publication:Würzburg
Year of Publication:2010
ISBN:978-3-8343-2404-7
Language:German
Parent Title (German):Embedded-Software-Engineering-Kongress : Tagungsband
First Page:443
Last Page:449
Document Type:Conference Proceeding
Institutes:Hochschule Offenburg / Bibliografie
Release Date:2014/10/22
Licence (German):License LogoEs gilt das UrhG