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Dynamic mapping of EDDL device descriptions to OPC UA

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Author:Axel Sikora, Manuel Schappacher, Kofi Atta Nsiah
Year of Publication:2017
Language:English
Parent Title (English):2nd International Conference on Measurement Instrumentation and Electronics. IOP Conf. Series: Journal of Physics: Conf. Series 870 (2017) 012006
First Page:1
Last Page:6
Document Type:Conference Proceeding
Institutes:Hochschule Offenburg / Bibliografie
Release Date:2018/01/19
Licence (German):License LogoEs gilt das UrhG
URL:http://iopscience.iop.org/1742-6596/870/1/012006/pdf/1742-6596_870_1_012006.pdf
DOI:https://doi.org/10.1088/1742-6596/870/1/012006