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Legacy to Industry 4.0: A Profibus Sniffer

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Author:Axel SikoraORCiDGND, Fesseha Tsegaye MamoGND, Christoph Rathfelder
Publisher:IOP Publishing
Year of Publication:2017
Parent Title (English):2nd International Conference on Measurement Instrumentation and Electronics. IOP Conf. Series: Journal of Physics: Conf. Series 870 (2017) 012002
First Page:1
Last Page:6
Document Type:Conference Proceeding
Institutes:Hochschule Offenburg / Bibliografie
Release Date:2018/01/19
Licence (German):License LogoEs gilt das UrhG