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Automated Physical Testbeds for Emulation of Wireless Networks

  • Institute of Reliable Embedded Systems and Communication Electronics, Offenburg University of Applied Sciences, Germany has developed an automated testing environment, Automated Physical TestBeds (APTB), for analyzing the performance of wireless systems and its supporting protocols. Wireless physical networking nodes can connect to this APTB and the antenna output of this attaches with the RFInstitute of Reliable Embedded Systems and Communication Electronics, Offenburg University of Applied Sciences, Germany has developed an automated testing environment, Automated Physical TestBeds (APTB), for analyzing the performance of wireless systems and its supporting protocols. Wireless physical networking nodes can connect to this APTB and the antenna output of this attaches with the RF waveguides. To model the RF environment this RF waveguides then establish wired connection among RF elements like splitters, attenuators and switches. In such kind of set up it’s well possible to vary the path characteristics by altering the attenuators and switches. The major advantage of using APTB is the possibility of isolated, well controlled, repeatable test environment in various conditions to run statistical analysis and even to execute regression tests. This paper provides an overview of the design and implementation of APTB, demonstrates its ability to automate test cases, and its efficiency.show moreshow less

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Metadaten
Author:Axel SikoraORCiDGND, Jubin Sebastian Elayanithottathil, Artem Yushev, Edgar Schmitt, Manuel Schappacher
Creating Corporation:MATEC Web of Conferences
Year of Publication:2016
Language:English
Tag:Eingebettetes System; Netzwerk; Simulation
Parent Title (English):International Conference on Measurement Instrumentation and Electronics (ICMIE 2016)
First Page:1
Last Page:5
Document Type:Conference Proceeding
Institutes:Hochschule Offenburg / Bibliografie
Release Date:2018/02/02
Licence (German):License LogoEs gilt das UrhG
DOI:https://doi.org/10.1051/matecconf/20167506006