Volltext-Downloads (blau) und Frontdoor-Views (grau)
The search result changed since you submitted your search request. Documents might be displayed in a different sort order.
  • search hit 1 of 6
Back to Result List

Automated Physical Testbeds for Emulation of Wireless Networks

  • Institute of Reliable Embedded Systems and Communication Electronics, Offenburg University of Applied Sciences, Germany has developed an automated testing environment, Automated Physical TestBeds (APTB), for analyzing the performance of wireless systems and its supporting protocols. Wireless physical networking nodes can connect to this APTB and the antenna output of this attaches with the RFInstitute of Reliable Embedded Systems and Communication Electronics, Offenburg University of Applied Sciences, Germany has developed an automated testing environment, Automated Physical TestBeds (APTB), for analyzing the performance of wireless systems and its supporting protocols. Wireless physical networking nodes can connect to this APTB and the antenna output of this attaches with the RF waveguides. To model the RF environment this RF waveguides then establish wired connection among RF elements like splitters, attenuators and switches. In such kind of set up it’s well possible to vary the path characteristics by altering the attenuators and switches. The major advantage of using APTB is the possibility of isolated, well controlled, repeatable test environment in various conditions to run statistical analysis and even to execute regression tests. This paper provides an overview of the design and implementation of APTB, demonstrates its ability to automate test cases, and its efficiency.show moreshow less

Export metadata

Additional Services

Search Google Scholar

Statistics

frontdoor_oas
Metadaten
Document Type:Conference Proceeding
Conference Type:Konferenzartikel
Zitierlink: https://opus.hs-offenburg.de/2333
Bibliografische Angaben
Title (English):Automated Physical Testbeds for Emulation of Wireless Networks
Conference:2016 International Conference on Measurement Instrumentation and Electronics (ICMIE 2016), June 6-8, 2016, Munich, Germany
Author:Axel SikoraStaff MemberORCiDGND, Jubin Sebastian ElayanithottathilStaff MemberGND, Artem YushevStaff MemberORCiDGND, Edgar SchmittStaff Member, Manuel SchappacherStaff MemberGND
Year of Publication:2016
First Page:1
Last Page:5
Article Number:06006
Parent Title (English):MATEC Web of Conferences
Editor:Axel Sikora, Ben Choi, Shuhui Wang
Volume:75
DOI:https://doi.org/10.1051/matecconf/20167506006
Language:English
Inhaltliche Informationen
Institutes:Forschung / ivESK - Institut für verlässliche Embedded Systems und Kommunikationselektronik
Fakultät Elektrotechnik und Informationstechnik (E+I) (bis 03/2019)
Institutes:Bibliografie
Tag:Eingebettetes System; Netzwerk; Simulation
Formale Angaben
Open Access: Open Access 
Licence (German):License LogoCreative Commons - CC BY - Namensnennung 4.0 International