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Finite Element Simulations for Predicting Nonlinear Responses of Layered SAW Systems

  • Increasing power density causes increased self-generation of harmonics and intermodulation. As this leads to violations of the strict linearity requirements, especially for carrier aggregation (CA), the nonlinearity must be considered in the design process of RF devices. This raises the demand of accurate simulation models. Linear and nonlinear P-Matrix/COM models are used during the design due toIncreasing power density causes increased self-generation of harmonics and intermodulation. As this leads to violations of the strict linearity requirements, especially for carrier aggregation (CA), the nonlinearity must be considered in the design process of RF devices. This raises the demand of accurate simulation models. Linear and nonlinear P-Matrix/COM models are used during the design due to their fast simulation times and accurate results. However, the finite element method (FEM) is useful to get a deeper insight in the device's nonlinearities, as the total field distributions can be visualized. The FE method requires complete sets of material tensors, which are unknown for most relevant materials in nonlinear micro-acoustics. In this work, we perform nonlinear FEM simulations, which allow the calculation of nonlinear field distributions of a lithium tantalate based layered SAW system up to third order. We aim at achieving good correspondence to measured data and determine the contributions of each material layer to the nonlinear signals. Therefore, we use approximations circumventing the issue of limited higher order tensor data. Experimental data for the third order nonlinearity is shown to validate the presented approach.show moreshow less

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Metadaten
Document Type:Conference Proceeding
Conference Type:Konferenzartikel
Zitierlink: https://opus.hs-offenburg.de/5379
Bibliografische Angaben
Title (English):Finite Element Simulations for Predicting Nonlinear Responses of Layered SAW Systems
Conference:IEEE International Ultrasonics Symposium (IUS), 11-16 Sept. 2021, Xi'an, China
Author:Thomas Forster, Vikrant Chauhan, Markus Mayer, Elena MayerStaff Member, Andreas MayerStaff MemberGND, Thomas Ebner, Karl Wagner, Amelie Hagelauer
Year of Publication:2021
Publisher:IEEE
Page Number:4
First Page:1
Last Page:4
Parent Title (English):IEEE IUS 2021 Symposium Proceedings
ISBN:978-1-6654-0355-9 (elektronisch)
ISBN:978-1-6654-4777-5 (Print on Demand)
ISSN:1948-5727 (elektronisch)
ISSN:1948-5719 (Print on Demand)
DOI:https://doi.org/10.1109/IUS52206.2021.9593732
Language:English
Inhaltliche Informationen
Institutes:Fakultät Wirtschaft (W)
Institutes:Bibliografie
Formale Angaben
Open Access: Closed Access 
Licence (German):License LogoUrheberrechtlich geschützt