Titan TTCN-3 Based Test Framework for Resource Constrained Systems
- Wireless communication systems more and more become part of our daily live. Especially with the Internet of Things (IoT) the overall connectivity increases rapidly since everyday objects become part of the global network. For this purpose several new wireless protocols have arisen, whereas 6LoWPAN (IPv6 over Low power Wireless Personal Area Networks) can be seen as one of the most importantWireless communication systems more and more become part of our daily live. Especially with the Internet of Things (IoT) the overall connectivity increases rapidly since everyday objects become part of the global network. For this purpose several new wireless protocols have arisen, whereas 6LoWPAN (IPv6 over Low power Wireless Personal Area Networks) can be seen as one of the most important protocols within this sector. Originally designed on top of the IEEE802.15.4 standard it is a subject to various adaptions that will allow to use 6LoWPAN over different technologies; e.g. DECT Ultra Low Energy (ULE). Although this high connectivity offers a lot of new possibilities, there are several requirements and pitfalls coming along with such new systems. With an increasing number of connected devices the interoperability between different providers is one of the biggest challenges, which makes it necessary to verify the functionality and stability of the devices and the network. Therefore testing becomes one of the key components that decides on success or failure of such a system. Although there are several protocol implementations commonly available; e.g., for IoT based systems, there is still a lack of according tools and environments as well as for functional and conformance testing. This article describes the architecture and functioning of the proposed test framework based on Testing and Test Control Notation Version 3 (TTCN-3) for 6LoWPAN over ULE networks.…
Document Type: | Conference Proceeding |
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Conference Type: | Konferenzartikel |
Zitierlink: | https://opus.hs-offenburg.de/2340 | Bibliografische Angaben |
Title (English): | Titan TTCN-3 Based Test Framework for Resource Constrained Systems |
Conference: | 2016 International Conference on Measurement Instrumentation and Electronics (ICMIE 2016), June 6-8, 2016, Munich, Germany |
Author: | Artem YushevORCiDGND, Manuel SchappacherStaff MemberGND, Axel SikoraStaff MemberORCiDGND |
Year of Publication: | 2016 |
Page Number: | 5 |
Article Number: | 06005 |
Parent Title (English): | MATEC Web of Conferences |
Editor: | Axel Sikora, Ben Choi, Shuhui Wang |
Volume: | 75 |
DOI: | https://doi.org/10.1051/matecconf/20167506005 |
Language: | English | Inhaltliche Informationen |
Institutes: | Forschung / ivESK - Institut für verlässliche Embedded Systems und Kommunikationselektronik |
Fakultät Elektrotechnik und Informationstechnik (E+I) (bis 03/2019) | |
Institutes: | Bibliografie |
Tag: | TTCN3; Testumgebung | Formale Angaben |
Open Access: | Open Access |
Licence (German): | Creative Commons - CC BY - Namensnennung 4.0 International |