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Automated Physical TestBeds (APTB 2.0): Enabling Reliable and Efficient Testing of Wireless Communication Networks for IoT and Industry 4.0

  • Wireless communication networks are crucial for enabling megatrends like the Internet of Things (IoT) and Industry 4.0. However, testing these networks can be challenging due to the complex network topology and RF characteristics, requiring a multitude of scenarios to be tested. To address this challenge, the authors developed and extended an automated testbed called Automated Physical TestBedWireless communication networks are crucial for enabling megatrends like the Internet of Things (IoT) and Industry 4.0. However, testing these networks can be challenging due to the complex network topology and RF characteristics, requiring a multitude of scenarios to be tested. To address this challenge, the authors developed and extended an automated testbed called Automated Physical TestBed (APTB). This testbed provides the means to conduct controlled tests, analyze coexistence, emulate multiple propagation paths, and model dependable channel conditions. Additionally, the platform supports test automation to facilitate efficient and systematic experimentation. This paper describes the extended architecture, implementation, and performance evaluation of the APTB testbed. The APTB testbed provides a reliable and efficient solution for testing wireless communication networks under various scenarios. The implementation and performance verification of the testbed demonstrate its effectiveness and usefulness for researchers and industry practitioners.show moreshow less

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Metadaten
Document Type:Conference Proceeding
Conference Type:Konferenzartikel
Zitierlink: https://opus.hs-offenburg.de/8343
Bibliografische Angaben
Title (English):Automated Physical TestBeds (APTB 2.0): Enabling Reliable and Efficient Testing of Wireless Communication Networks for IoT and Industry 4.0
Conference:International Conference on Industrial Informatics (21. : 18-20 July 2023 : Lemgo, Germany)
Author:Axel SikoraStaff MemberORCiDGND, Fabian SowiejaStaff Member, Jubin Sebastian ElayanithottathilStaff MemberGND, Manuel SchappacherStaff MemberGND, Wacime HadrichStaff Member
Year of Publication:2023
Date of first Publication:2023/08/22
Publisher:IEEE
First Page:1
Last Page:7
Parent Title (English):2023 IEEE 21st International Conference on Industrial Informatics : INDIN 2023
ISBN:978-1-6654-9313-0 (Elektronisch)
ISBN:978-1-6654-9314-7 (Print on Demand)
ISSN:2378-363X (Elektronisch)
ISSN:1935-4576 (Print on Demand)
DOI:https://doi.org/10.1109/INDIN51400.2023.10218143
URL:https://ieeexplore.ieee.org/document/10218143
Language:English
Inhaltliche Informationen
Institutes:Forschung / ivESK - Institut für verlässliche Embedded Systems und Kommunikationselektronik
Fakultät Elektrotechnik, Medizintechnik und Informatik (EMI) (ab 04/2019)
Institutes:Bibliografie
Tag:Performance evaluation; Radio frequency; Testbed; Wireless IoT
Formale Angaben
Relevance:Konferenzbeitrag: h5-Index < 30
Open Access: Closed 
Licence (German):License LogoUrheberrechtlich geschützt