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Instabilities of the interface between two thin liquid films under DC electroosmotic flow are investigated using linear stability analysis followed by an asymptotic analysis in the long-wave limit. The two-liquid system is bounded by two rigid plates which act as substrates. The Boltzmann charge distribution is considered for the two electrolyte solutions and gives rise to a potential distribution in these liquids. The effect of van der Waals interactions in these thin films is incorporated in the momentum equations through the disjoining pressure. Marginal stability and growth rate curves are plotted in order to identify the thresholds for the control parameters when instabilities set in. If the upper liquid is a dielectric, the applied electric field can have stabilizing or destabilizing effects depending on the viscosity ratio due to the competition between viscous and electric forces. For viscosity ratio equal to unity, the stability of the system gets disconnected from the electric parameters like interface zeta potential and electric double-layer thickness. As expected, disjoining pressure has a destabilizing effect, and capillary forces have stabilizing effect. The overall stability trend depends on the complex contest between all the above-mentioned parameters. The present study can be used to tune these parameters according to the stability requirement.
In this study the dynamics and stability of thin and electrically conductive aqueous films under the influence of a time-periodic electric field are explored. With the help of analytical linear stability analysis for long wavelength disturbances, the stability threshold of the system as a function of various electrochemical parameters and transport coefficients is presented. The contributions of parameters like surface tension, disjoining pressure, electric double layer (Debye length and interfacial zeta potential), and unsteady Maxwell and viscous stresses are highlighted with the help of appropriate dimensionless groups. The physical mechanisms affecting the stability of thin films are detailed with the above-mentioned forces and parametric dependence of stability trends is discussed.