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Bleyl, Ingo
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Honal, Matthias
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Jäger, Philipp M.
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Kirschner, Hans-Peter
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Knapp, Matthias
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Accurate characterization of SiO2 thin films using surface acoustic waves
(2015)
Knapp, Matthias
;
Lomonosov, Alexey M.
;
Warkentin, Paul
;
Jäger, Philipp M.
;
Ruile, Werner
;
Kirschner, Hans-Peter
;
Honal, Matthias
;
Bleyl, Ingo
;
Mayer, Andreas
;
Reindl, Leonhard Michael
1
to
1
