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Novel manufacturing technologies, such as printed electronics, may enable future applications for the Internet of Everything like large-area sensor devices, disposable security, and identification tags. Printed physically unclonable functions (PUFs) are promising candidates to be embedded as hardware security keys into lightweight identification devices. We investigate hybrid PUFs based on a printed PUF core. The statistics on the intra- and inter-hamming distance distributions indicate a performance suitable for identification purposes. Our evaluations are based on statistical simulations of the PUF core circuit and the thereof generated challenge-response pairs. The analysis shows that hardware-intrinsic security features can be realized with printed lightweight devices.
A physical unclonable function (PUF) is a hardware circuit that produces a random sequence based on its manufacturing-induced intrinsic characteristics. In the past decade, silicon-based PUFs have been extensively studied as a security primitive for identification and authentication. The emerging field of printed electronics (PE) enables novel application fields in the scope of the Internet of Things (IoT) and smart sensors. In this paper, we design and evaluate a printed differential circuit PUF (DiffC-PUF). The simulation data are verified by Monte Carlo analysis. Our design is highly scalable while consisting of a low number of printed transistors. Furthermore, we investigate the best operating point by varying the PUF challenge configuration and analyzing the PUF security metrics in order to achieve high robustness. At the best operating point, the results show areliability of 98.37% and a uniqueness of 50.02%, respectively. This analysis also provides useful and comprehensive insights into the design of hybrid or fully printed PUF circuits. In addition, the proposed printed DiffC-PUF core has been fabricated with electrolyte-gated field-effect transistor technology to verify our design in hardware.
Neuromorphic computing systems have demonstrated many advantages for popular classification problems with significantly less computational resources. We present in this paper the design, fabrication and training of a programmable neuromorphic circuit, which is based on printed electrolytegated field-effect transistor (EGFET). Based on printable neuron architecture involving several resistors and one transistor, the proposed circuit can realize multiply-add and activation functions. The functionality of the circuit, i.e. the weights of the neural network, can be set during a post-fabrication step in form of printing resistors to the crossbar. Besides the fabrication of a programmable neuron, we also provide a learning algorithm, tailored to the requirements of the technology and the proposed programmable neuron design, which is verified through simulations. The proposed neuromorphic circuit operates at 5V and occupies 385mm 2 of area.
In many application domains, in particular automotives, guaranteeing a very low failure rate is crucial to meet functional and safety standards. Especially, reliable operation of memory components such as SRAM cells is of essential importance. Due to aggressive technology downscaling, process and runtime variations significantly impact manufacturing yield as well as functionality. For this reason, a thorough memory failure rate assessment is imperative for correct circuit operation and yield improvement. In this regard, Monte Carlo simulations have been used as the conventional method to estimate the variability induced failure rate of memory components. However, Monte Carlo methods become infeasible when estimating rare events such as high-sigma failure rates. To this end, Importance Sampling methods have been proposed which reduce the number of required simulations substantially. However, existing methods still suffer from inaccuracies and high computational efforts, in particular for high-sigma problems. In this paper, we fill this gap by presenting an efficient mixture Importance Sampling approach based on Bayesian optimization, which deploys a surface model of the objective function to find the most probable failure points. Its advantages include constant complexity independent of the dimensions of design space, the potential to find the global extrema, and higher trustworthiness of the estimated failure rate by accurately exploring the design space. The approach is evaluated on a 6T-SRAM cell as well as a master-slave latch based on a 28nm FDSOI process. The results show an improvement in accuracy, resulting in up to 63× better accuracy in estimating failure rates compared to the best state-of-the-art solutions on a 28nm technology node.
Emerging applications in soft robotics, wearables, smart consumer products or IoT-devices benefit from soft materials, flexible substrates in conjunction with electronic functionality. Due to high production costs and conformity restrictions, rigid silicon technologies do not meet application requirements in these new domains. However, whenever signal processing becomes too comprehensive, silicon technology must be used for the high-performance computing unit. At the same time, designing everything in flexible or printed electronics using conventional digital logic is not feasible yet due to the limitations of printed technologies in terms of performance, power and integration density. We propose to rather use the strengths of neuromorphic computing architectures consisting in their homogeneous topologies, few building blocks and analog signal processing to be mapped to an inkjet-printed hardware architecture. It has remained a challenge to demonstrate non-linear elements besides weighted aggregation. We demonstrate in this work printed hardware building blocks such as inverter-based comprehensive weight representation and resistive crossbars as well as printed transistor-based activation functions. In addition, we present a learning algorithm developed to train the proposed printed NCS architecture based on specific requirements and constraints of the technology.
Printed electronics (PE) offers flexible, extremely low-cost, and on-demand hardware due to its additive manufacturing process, enabling emerging ultra-low-cost applications, including machine learning applications. However, large feature sizes in PE limit the complexity of a machine learning classifier (e.g., a neural network (NN)) in PE. Stochastic computing Neural Networks (SC-NNs) can reduce area in silicon technologies, but still require complex designs due to unique implementation tradeoffs in PE. In this paper, we propose a printed mixed-signal system, which substitutes complex and power-hungry conventional stochastic computing (SC) components by printed analog designs. The printed mixed-signal SC consumes only 35% of power consumption and requires only 25% of area compared to a conventional 4-bit NN implementation. We also show that the proposed mixed-signal SC-NN provides good accuracy for popular neural network classification problems. We consider this work as an important step towards the realization of printed SC-NN hardware for near-sensor-processing.
Amorphous In-Ga-Zn-O (IGZO) is a high-mobility semiconductor employed in modern thin-film transistors for displays and it is considered as a promising material for Schottky diode-based rectifiers. Properties of the electronic components based on IGZO strongly depend on the manufacturing parameters such as the oxygen partial pressure during IGZO sputtering and post-deposition thermal annealing. In this study, we investigate the combined effect of sputtering conditions of amorphous IGZO (In:Ga:Zn=1:1:1) and post-deposition thermal annealing on the properties of vertical thin-film Pt-IGZO-Cu Schottky diodes, and evaluated the applicability of the fabricated Schottky diodes for low-frequency half-wave rectifier circuits. The change of the oxygen content in the gas mixture from 1.64% to 6.25%, and post-deposition annealing is shown to increase the current rectification ratio from 10 5 to 10 7 at ±1 V, Schottky barrier height from 0.64 eV to 0.75 eV, and the ideality factor from 1.11 to 1.39. Half-wave rectifier circuits based on the fabricated Schottky diodes were simulated using parameters extracted from measured current-voltage and capacitance-voltage characteristics. The half-wave rectifier circuits were realized at 100 kHz and 300 kHz on as-fabricated Schottky diodes with active area of 200 μm × 200 μm, which is relevant for the near-field communication (125 kHz - 134 kHz), and provided the output voltage amplitude of 0.87 V for 2 V supply voltage. The simulation results matched with the measurement data, verifying the model accuracy for circuit level simulation.
Embedded Analog Physical Unclonable Function System to Extract Reliable and Unique Security Keys
(2020)
Internet of Things (IoT) enabled devices have become more and more pervasive in our everyday lives. Examples include wearables transmitting and processing personal data and smart labels interacting with customers. Due to the sensitive data involved, these devices need to be protected against attackers. In this context, hardware-based security primitives such as Physical Unclonable Functions (PUFs) provide a powerful solution to secure interconnected devices. The main benefit of PUFs, in combination with traditional cryptographic methods, is that security keys are derived from the random intrinsic variations of the underlying core circuit. In this work, we present a holistic analog-based PUF evaluation platform, enabling direct access to a scalable design that can be customized to fit the application requirements in terms of the number of required keys and bit width. The proposed platform covers the full software and hardware implementations and allows for tracing the PUF response generation from the digital level back to the internal analog voltages that are directly involved in the response generation procedure. Our analysis is based on 30 fabricated PUF cores that we evaluated in terms of PUF security metrics and bit errors for various temperatures and biases. With an average reliability of 99.20% and a uniqueness of 48.84%, the proposed system shows values close to ideal.
Physically Unclonable Functions (PUFs) are hardware-based security primitives, which allow for inherent device fingerprinting. Therefore, intrinsic variation of imperfect manufactured systems is exploited to generate device-specific, unique identifiers. With printed electronics (PE) joining the internet of things (IoT), hardware-based security for novel PE-based systems is of increasing importance. Furthermore, PE offers the possibility for split-manufacturing, which mitigates the risk of PUF response readout by third parties, before commissioning. In this paper, we investigate a printed PUF core as intrinsic variation source for the generation of unique identifiers from a crossbar architecture. The printed crossbar PUF is verified by simulation of a 8×8-cells crossbar, which can be utilized to generate 32-bit wide identifiers. Further focus is on limiting factors regarding printed devices, such as increased parasitics, due to novel materials and required control logic specifications. The simulation results highlight, that the printed crossbar PUF is capable to generate close-to-ideal unique identifiers at the investigated feature size. As proof of concept a 2×2-cells printed crossbar PUF core is fabricated and electrically characterized.