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Proposals for Error-Reduction in Planar Chromatography

  • A new diode-array scanner in combination with a computer-controlled application system meets all the demands of modern HPTLC measurement. Automatic application, simultaneous measurements at different wavelengths, and different linearization models enable appropriate evaluation of all analytical questions. The theory of error propagation recommends quantification at reflectance values smaller thanA new diode-array scanner in combination with a computer-controlled application system meets all the demands of modern HPTLC measurement. Automatic application, simultaneous measurements at different wavelengths, and different linearization models enable appropriate evaluation of all analytical questions. The theory of error propagation recommends quantification at reflectance values smaller than 0.8; this can be verified only by use of diode-array scanning. The same theory also recommends quantification by use of peak height data, because the theory predicts best precision only for peak height evaluation. Diode-array scanning with reflectance monitoring enables appropriate validation in TLC and HPTLC analysis. All these aspects result in substantial improvement of in-situ quantitative densitometric analysis, and simultaneous recording at different wavelengths opens the way for chemometric evaluation, e.g. peak purity monitoring, which improves the accuracy and reliability of HPTLC analysis.show moreshow less

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Metadaten
Document Type:Article (reviewed)
Zitierlink: https://opus.hs-offenburg.de/7290
Bibliografische Angaben
Title (English):Proposals for Error-Reduction in Planar Chromatography
Author:Bernd SpangenbergStaff MemberORCiDGND, Karl-Friedrich Klein, Joachim Mannhardt
Year of Publication:2002
Publisher:Akadémiai Kiadó
First Page:204
Last Page:209
Parent Title (English):JPC : Journal of Planar Chromatography - Modern TLC
Volume:15
Issue:3
ISSN:1789-0993 (Online)
ISSN:0933-4173 (Print)
DOI:https://doi.org/10.1556/JPC.15.2002.3.9
Language:English
Inhaltliche Informationen
Institutes:Fakultät Maschinenbau und Verfahrenstechnik (M+V)
Institutes:Bibliografie
Tag:Diode-array detection; Reflectance; Scanner; Systematic and statistical errors; TLC
Formale Angaben
Open Access: Closed 
Licence (German):License LogoUrheberrechtlich geschützt