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Accuracy Improvements of Identification and Authentication of Devices by EM-Measurements

  • The authentication method of electronic devices, based on individual forms of correlograms of their internal electric noises, is well-known. Specific physical differences in the components – for example, caused by variations in production quality – cause specific electrical signals, i.e. electric noise, in the electronic device. It is possible to obtain this information and to identify theThe authentication method of electronic devices, based on individual forms of correlograms of their internal electric noises, is well-known. Specific physical differences in the components – for example, caused by variations in production quality – cause specific electrical signals, i.e. electric noise, in the electronic device. It is possible to obtain this information and to identify the specific differences of the individual devices using an embedded analog-to-digital converter (ADC). These investigations confirm the possibility to identify and authenticate electronic devices using bit templates, calculated from the sequence of values of the normalized autocorrelation function of noise. Experiments have been performed using personal computers. The probability of correct identification and authentication increases with increasing noise recording duration. As a result of these experiments, an accuracy of 98.1% was achieved for a 1 second-long registration of EM for a set of investigated computers.show moreshow less

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Metadaten
Author:Axel SikoraORCiDGND, Elena Nyemkova, Yuriy Lakh
Creating Corporation:IEEE
Year of Publication:2020
Pagenumber:5
ISBN:978-1-7281-9960-3 (digital)
ISBN:978-1-7281-9961-0 (Print on Demand)
Language:English
Parent Title (English):IEEE IDAACS-SWS 2020 : Conference Proceedings
Document Type:Conference Proceeding
Institutes:Bibliografie
Open Access:Zugriffsbeschränkt
Release Date:2021/01/18
Licence (German):License LogoEs gilt das UrhG
Note:
Konferenz: 2020 IEEE 5th International Symposium on Smart and Wireless Systems within the Conferences on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS-SWS), 17-18 Sept. 2020, Dortmund, Germany
DOI:https://doi.org/10.1109/IDAACS-SWS50031.2020.9297071