• search hit 7 of 12
Back to Result List

Legacy to Industry 4.0: A Profibus Sniffer

Export metadata

Additional Services

Share in Twitter Search Google Scholar
Metadaten
Author:Axel Sikora, Fesseha Tsegaye Mamo, Christoph Rathfelder
Publisher:IOP Publishing
Year of Publication:2017
Language:English
Parent Title (English):2nd International Conference on Measurement Instrumentation and Electronics. IOP Conf. Series: Journal of Physics: Conf. Series 870 (2017) 012002
First Page:1
Last Page:6
Document Type:Conference Proceeding
Institutes:Hochschule Offenburg / Bibliografie
Release Date:2018/01/19
Licence (German):License LogoEs gilt das UrhG
URL:http://iopscience.iop.org/1742-6596/870/1/012002/pdf/1742-6596_870_1_012002.pdf
DOI:https://doi.org/10.1088/1742-6596/870/1/012002